Tag: Huvics

  • Manual Inspection vs Automated Cleaning and Drying System, Where Semiconductor Yield Is Decided

    Manual Inspection vs Automated Cleaning and Drying System, Where Semiconductor Yield Is Decided

    Precisely integrated circuit patterns on a semiconductor wafer.

    There is a saying among semiconductor process engineers. “If you take cleaning lightly, you can easily lose yield.” Of course, it is hard to confirm whether anyone actually says this, but that is exactly the atmosphere on the production floor. A single speck of dust or one drop of oil can bring down an entire process that has been built with extreme precision. Cleaning may look like the final step of a process, but in reality, it is the starting line of quality.

    A close up view of microscopic particles scattered across the surface of a semiconductor wafer.

    The Impact of Microscopic Contamination Particles on Yield

    In semiconductor and advanced electronic component manufacturing, microscopic contamination particles are not simple impurities. According to analysis by TSI, a single particle on a wafer can lead to failures in multiple integrated circuits and significantly reduce overall yield. What makes the issue even more demanding is size. The fact that particles as small as 0.05 micrometers can cause critical defects in semiconductor chips clearly shows that the cleaning process is not just a simple act of washing.

    It is already widely recognized in the industry that particle defects account for a significant share of all defects in high density electronics manufacturing. As ultra fine processes become standard, contamination tolerance limits become even tighter, and the technical completeness of the cleaning stage is increasingly determining the reliability of the final product.

    A high pressure stream of water sprayed from a nozzle washing the surface of a component.

    Multi Stage Cleaning and Drying Technology of the Cleaner System

    The Cleaner System approaches this problem step by step. Its configuration, consisting of Micro Bubble, Water Jet, Air Knife, and Oven Dry, allows each stage to remove contamination and complete drying in a different way.

    Micro bubbles are fine bubbles with diameters ranging from 10 micrometers to several tens of micrometers. They are generated when dissolved air reaches a certain concentration and physically separate contamination particles adhered to the surface. Water Jet removes surface residues with a high pressure water flow, while Air Knife pushes away moisture with a sharp air stream to create the proper condition for the next stage. The final Oven Dry stage completely removes remaining moisture and completes the drying process.

    Depending on the product type, such as camera modules, sensors, VCM motors, and trays, a Full Auto or Manual configuration can be selected to match the conditions of the production site. It is implemented through a design method that treats cleaning and drying not as separate processes, but as one continuous flow.

    Combining Vision Inspection and Ultrasonic Dispersion Technology

    Precision is also required without compromise in the quality verification stage after cleaning. While manual inspection, even when performed by skilled operators, remains at an accuracy level of 85~90%, research published on ResearchGate shows that automated optical inspection(AOI) achieves 98~99% accuracy and processing efficiency of more than 5,000 units per hour. At the point where the human eye reaches the limits of fatigue and concentration, algorithms operate without fluctuation.

    Huvics applies this principle to MLCC and FPCB processes by combining its proprietary ultrasonic dispersion technology with vision inspection algorithms. Ultrasonic dispersion increases particle separation efficiency during the cleaning stage, and the vision inspection algorithm detects remaining defects down to a microscopic level afterward. Because the two technologies operate sequentially, the performance of one stage supports the effectiveness of the other. The key is to connect the cleaning process and the inspection process within a single quality management system, rather than treating them separately.

    Multiple wafers moving along automated equipment.

    There is something often overlooked when selecting a cleaning and drying system. It is not just the performance of the equipment, but how it connects with the entire process. No matter how precise the cleaning technology is, if it does not align with the inspection stage, defects are found too late and yield loss has already accumulated. In semiconductor and advanced component manufacturing, quality stability is not created by the completeness of a single process, but by the entire flow from cleaning to drying and inspection. How that flow is designed ultimately determines product reliability.


    Huvics is an advanced technology company that develops and manufactures automation equipment and
    production systems across the semiconductor, LED, Mobile, and Cosmetic industries.
    With top talent and continuous technological innovation, Huvics supports customers in improving productivity and
    securing quality competitiveness.

    Huvics Contact

    Phone: 031-374-8285
    Email: cdpark@huvics.com

    Huvics Inquiry

  • How the Integrated Lamination·Cleaning Process Improves Stacked Semiconductor Yield

    How the Integrated Lamination·Cleaning Process Improves Stacked Semiconductor Yield

    A semiconductor manufacturing site where wafers move along connected conveyor belts

    To reduce defect rates in semiconductor processes, many manufacturers have focused on improving the precision of individual equipment. Typical approaches include adopting more sophisticated stencils and faster inspection equipment. However, even when the performance of each piece of equipment is enhanced, contamination and alignment errors that occur during transfer between processes still hold back yield. It is now time for an integrated design perspective that connects the entire process into one continuous flow.

    A scene showing blue tape being attached to and peeled from a wafer surface

    Why tape attachment and UV curing determine stacked packaging quality

    In stacked semiconductor packaging, tape attachment and UV curing are not simply auxiliary material processes. The entire sequence from fixing chips onto the wafer to peeling them accurately after dicing depends on these two steps.

    UV curing technology creates immediate adhesion and high tensile strength the moment ultraviolet light activates the photoinitiator inside the adhesive. When ultraviolet light is applied again afterward, adhesion decreases, allowing the chip to be removed cleanly from the tape. If this precise control of adhesion and peeling is not achieved, residual adhesive may remain on the chip surface or microcracks may occur during peeling.

    Especially in ultra-fine packages with a pitch level of 0.3~0.4mm, placement alignment errors must be controlled within several tens of micrometers, and variations in curing timing and intensity lead directly to process defects. As stacked structures become more complex, requirements for thickness uniformity and flatness of each layer also increase.

    Because even slight variations that occur during the tape attachment stage are amplified later in grinding or dicing processes, the stability of the initial adhesion process becomes the baseline for overall yield. Ultimately, maintaining consistent UV exposure uniformity and adhesive strength is the key to stacked packaging quality.

    An integrated laminator system combining an expander and mounter into one unit

    How an integrated laminator structure enhances process quality

    Problems that arise when process equipment is operated separately often come not from the performance of the equipment itself, but from the sections between equipment. Every time a wafer or substrate moves from the expander to the tape mounter and then to the UV curing equipment, the possibility of foreign particle inflow and alignment deviation arises. For process managers, the parameters of each piece of equipment must be managed separately, and it is also difficult to identify at which stage a problem that occurred during transfer originated.

    As the number of transfers decreases, contamination contact points are reduced and continuity of conditions between processes is secured. For this reason, one-stop laminator structures that handle everything from expanding to UV curing within a single system are gaining attention.

    The Huvics laminator system integrates lamination, tape mounting, and UV curing into one flow to reduce quality variables that occur during transfer between processes, while its UV curing system supporting both lamp and LED methods secures adhesive strength and process stability together. With both semi-auto and manual options, it flexibly supports everything from high-mix, low-volume production to mass production lines.

    By simplifying the process, takt time is reduced, and a workflow that eliminates bottlenecks is becoming established on manufacturing floors.

    A cleaning process that removes contaminants from a wafer surface using liquid sprayed from a nozzle

    Why the cleaning process determines final yield

    The cleaning process is often regarded as a finishing step that wipes the surface after assembly is completed, but in reality, it is closer to the starting point that determines final quality stability. Contaminant particles only a few micrometers in size remaining on the semiconductor surface can cause poor electrical contact or degraded optical characteristics, which directly leads to yield loss.

    According to industry analysis, a 1% increase in yield in semiconductor manufacturing can generate an estimated additional net profit of about 150 million dollars, showing that the economic impact created by differences in cleaning efficiency is significant.

    The Huvics cleaner system uses a multi-stage cleaning method that combines micro bubbles, water jet, and air knife to remove contaminant particles from product surfaces step by step. It optimizes cleaning conditions for products with diverse shapes and materials, such as camera modules, sensors, VCM motors, and trays, and is equipped with an oven drying function to completely remove residual moisture after cleaning. Users can choose between full-auto and manual methods depending on line conditions, allowing flexible response to both process automation and maintenance.

    As particle removal efficiency increases, defect rates decrease, and the rework ratio in subsequent inspection processes is also reduced through a chain effect. Only when cleaning is complete does the entire process close, and its meaning is confirmed in the final shipment quality figures.

    Light being evenly applied over multiple wafers arranged at regular intervals

    In semiconductor processes, quality depends not on the performance of any single piece of equipment, but on how tightly each process is connected to the next. Only when the precision of tape attachment, the uniformity of UV curing, and the completeness of cleaning each perform their roles can the yield curve become stable. Reducing gaps between separated equipment and designing the process flow as one connected system is the direction that manufacturing sites need today.


    Huvics is an advanced technology company that develops and manufactures automation equipment and
    production systems across the semiconductor, LED, Mobile, and Cosmetic industries.
    With top talent and continuous technological innovation, Huvics helps customers improve productivity and
    secure quality competitiveness.

    Huvics Contact Information

    Phone: 031-374-8285
    Email: cdpark@huvics.com

    Huvics Inquiry

  • From Semiconductor Cleaning to Grinding, Step-by-Step Process Technologies That Protect Yield

    From Semiconductor Cleaning to Grinding, Step-by-Step Process Technologies That Protect Yield

    Semiconductor cleaning equipment implementing a multi-stage cleaning combination

    In semiconductor processes, cleaning was long considered a finishing stage. It was widely viewed as a supporting procedure that removes foreign matter before moving on to the next process. However, as chip integration has increased and package structures have become more complex, we have entered an era where a single cleaning method can determine overall yield. What type of bubbles are used, in what sequence drying takes place, and at what pressure cleaning is performed are now treated as key variables in process design.

    A micro-nano bubble generation scene that removes contamination by distributing fine bubbles in water

    Two Requirements of Cleaning Technology: Removal and Preservation

    The core of cleaning technology lies in removing contaminant particles while fully preserving the product surface. These two requirements conflict with each other. Increasing cleaning power raises the risk of surface damage, while choosing a safer method can leave residual contamination behind.

    The micro jet method instantaneously generates energy reaching thousands of atmospheres and thousands of degrees, and for fine pattern structures below 70 nanometers, this energy itself can become a source of damage. For this reason, in cleaning equipment design, energy control and dispersion methods become key criteria that define the level of technology.

    The micro-nano bubble method distributes bubbles with a diameter of 0.1 micrometers or less in water to separate surface contamination, an approach designed to secure cleaning performance without physical impact. Multi-stage cleaning design combines different principles in this way to respond to the types of contamination generated at each process step.

    For products with complex surface structures and sensitive internal components, such as camera modules, sensors, and VCM motors, the limitations of a single cleaning method are clear. Combining Micro Bubble, Water Jet, and Air Knife step by step, while controlling residual moisture through Oven Dry functionality, is a configuration designed to meet these complex requirements. In processes where cleaning quality is directly linked to the final defect rate, which technology combination to choose is no longer a matter of equipment specifications, but a matter of process strategy.

    A micron-level precision grinding process in which a rotating diamond wheel uniformly processes the substrate surface

    Package Thickness Uniformity and Ultra-Precision Grinding Technology

    Another variable that determines the quality of semiconductor processes as much as cleaning technology is the uniformity of package thickness. In structures where multiple chips are vertically stacked, such as AI semiconductors and high-performance memory, thickness variation in each layer affects both electrical characteristics and mechanical reliability. It is also known that in RF applications, substrate thickness and resistivity affect parasitic capacitance, thereby determining signal integrity.

    The semiconductor industry roadmap requires wafer bonding processes to achieve thickness uniformity within ±5% across the entire wafer surface. If this standard is not met, stacking itself becomes meaningless.

    Huvics PKG Grinder performs micron-level grinding for various package types such as FCBGA, WLCSP, and QFN/DFN by using a high-precision stage and diamond wheel. It is available in Full Auto and Manual Type configurations to secure production line flexibility while being designed to maintain consistent thickness uniformity in high-speed processes. Regardless of which package structure is selected, how tightly thickness variation is managed is the key factor that separates product grade and yield.

    An operator wearing a cleanroom suit manually inspecting a wafer through a microscope

    The Impact of Automation Transition on Yield and Availability

    As the precision of process technology increases, the importance of how equipment is operated to implement it consistently also grows. Processes manually performed by skilled operators rely on individual experience and judgment, which creates structural limitations in repeatability and reproducibility. Even with the same equipment, results vary depending on the operating method, and those differences lead to yield variation in mass-production environments.

    Cases have been reported in which efficiency increased by approximately 17.6% when a systematic yield improvement framework was introduced compared with manual empirical methods. Automation transition is not simply a matter of increasing speed, but of securing process consistency and predictability. According to a McKinsey report, improving equipment reliability can increase tool availability in fabs by more than 15%. Higher availability means fewer unplanned equipment stops and maintenance gaps, which connects directly to the stability of the overall production plan.

    A configuration that combines Full Auto and Manual options is a strategy for flexibly responding to these needs, and many cases have accumulated in manufacturing sites where the level of process automation has been increased step by step.

    Semiconductor chips arranged in a tray after securing quality through cleaning and grinding

    In semiconductor processes, cleaning and grinding may appear to be separate technical domains, but they ultimately converge on the same question. How should the surface be handled so that the next process can proceed reliably. Bubble size, pressure control, thickness uniformity, equipment availability, all these variables make up the details of the process, and the sum of those details determines the reliability of the final product. Yield is not reserved at the design stage, but is protected or lost at every step of the process.


    Huvics is an advanced technology company that develops and manufactures automation equipment and
    production systems across the semiconductor, LED, Mobile, and Cosmetic industries.
    With top talent and continuous technological innovation, we support customers in improving productivity and
    securing quality competitiveness.

    Huvics Contact Information

    Phone: 031-374-8285
    Email: cdpark@huvics.com

    Huvics Inquiry

  • 3 Core Principles Behind How Semiconductor Cleaning Processes Affect Yield and Production Cost—How Are You Managing Them?

    3 Core Principles Behind How Semiconductor Cleaning Processes Affect Yield and Production Cost—How Are You Managing Them?

    Close-up view of a silicon substrate engraved with fine circuit patterns

    In semiconductor production lines, one point many still overlook is that more than half of defects originate from invisible microscopic contaminants. A single cleaning process determines yield, and yield directly determines unit cost. Once you understand this connection, it becomes clear why precision cleaning technology is treated as a critical variable in semiconductor manufacturing.

    Silicon wafer with precise fine circuit patterns highlighted

    Why the Cleaning Process Determines Yield and Production Cost

    In semiconductor manufacturing, cleaning is not a finishing process but the starting point of quality. A single microscopic particle left on the chip surface can cause a circuit short or damage an insulating layer, turning the entire chip into a defective product. As this problem accumulates, yield drops, and as yield drops, the cost required to produce each chip rises.

    According to analysis by KeyLink, manufacturing yield loss caused by inefficient cleaning reaches 5~15%, while the introduction of precision cleaning equipment has been shown to reduce defect-related yield loss by 8~12%. When these loss rates are viewed numerically, it becomes clear that the precision of the cleaning process is directly tied to cost competitiveness.

    As chip integration increases, the allowable size of contaminant particles becomes smaller, and cleaning requirements become more demanding. As process nodes become finer, the cleaning frequency itself also increases. Some reports show that advanced process nodes require more than 30% more cleaning steps than legacy nodes. Ultimately, the precision and stability of cleaning technology are key factors that shape the overall production cost structure.

    Numerous microbubbles gathered in liquid

    How Multi-Step Cleaning Technology Improves Microscopic Contaminant Removal Efficiency

    Microbubbles generate bubbles measuring several tens of micrometers in water and physically separate nanoparticles adhered to surfaces. The shock waves generated when the bubbles collapse, known as cavitation, instantaneously create jet speeds of up to 1,096 m/s. An MDPI study confirmed that microbubbles remove nanoparticles from silicon substrates with 90% efficiency without damaging the substrate structure.

    Residual contaminants that are difficult to remove with microbubbles alone are then washed away by a water jet using high-pressure water flow. In the next stage, an air knife removes surface moisture and remaining particles with a sharp stream of air. When these three technologies are applied in sequence, each following stage compensates for the limitations of the previous one.

    Components requiring optical precision, such as camera modules and autonomous driving sensors, require ISO Class 5 cleanliness at the point of optical system integration, and it is difficult to meet this standard consistently with a single cleaning method. Huvics’ 4-step cleaning and drying system addresses these requirements by arranging microbubble, water jet, and air knife processes sequentially, enabling the removal of microscopic contaminants from the surfaces of ultra-precision components such as camera modules and autonomous driving sensors.

    Heated processing oven equipment receiving parts through a conveyor belt

    How Integrated Cleaning and Drying Design Meets Automotive Electronics Quality Standards

    The automotive electronics industry requires strict quality standards across the entire manufacturing environment. The IATF 16949 standard requires temperature, humidity, and contamination levels in manufacturing facilities to be maintained below specified limits, and this concept also includes the management of residual moisture after cleaning. Even if cleaning is performed with high precision, any moisture remaining in the drying stage can lead to corrosion or electrical failure. For this reason, cleaning and drying should be designed not as separate processes but as one continuous process.

    Huvics’ cleaner system uses a built-in oven drying function to handle everything from cleaning to drying within a single piece of equipment. If the process is not separated, recontamination during transfer can be avoided, and if separate drying equipment is not operated, process time and equipment costs are reduced accordingly. This batch processing structure reduces both types of loss at the same time.

    As the defect rate decreases, the number of discarded parts falls, and rework costs are also reduced. As precision requirements for semiconductors and automotive electronics components continue to rise, process designs that integrate cleaning and drying are becoming a key tool for managing production costs.

    Large manufacturing equipment installed inside a cleanroom under strict management standards

    The view that cleaning is merely a procedure for maintaining cleanliness became outdated long ago. Protecting yield means protecting cost, and the fact that this begins with the cleaning stage becomes even clearer as semiconductor processes become finer. A process design that extends from microbubbles to oven drying is the result of implementing this logic directly into the equipment structure.


    Huvics is an advanced technology company that develops and manufactures automation equipment and
    production systems across the semiconductor, LED, Mobile, and Cosmetic industries.
    With outstanding talent and continuous technological innovation, we support customers in improving productivity and
    securing quality competitiveness.

    Huvics Contact Information

    Tel: 031-374-8285
    Email: cdpark@huvics.com

    Huvics Inquiry

  • 3 Key Process Factors That Reduce Semiconductor Manufacturing Unit Cost – Yield, Cleaning, Grinding Precision

    3 Key Process Factors That Reduce Semiconductor Manufacturing Unit Cost – Yield, Cleaning, Grinding Precision

    An automated production line showing the complex systems of semiconductor processes.

    Many managers at semiconductor manufacturing sites still lack a clear view of the specific causes of cost loss at each process stage. As a result, yield gradually declines again and again, or defects are discovered only in the back-end process, causing the costs already invested to be lost entirely. If you have never examined in numbers where and how much loss occurs in each process, you are already missing the starting point for reducing unit cost.

    Fine circuit patterns implemented on a wafer loaded with numerous chips.

    A 1% Yield Difference Can Decide Millions of Dollars

    Semiconductor manufacturing unit cost ultimately comes down to yield. Hundreds of processes are interconnected before a single chip is completed, and contamination or thickness non-uniformity in any one stage can instantly consume the value of every process that follows.

    According to an analysis by Applied Physics USA, in a production environment where more than 500 chips are loaded on a 300mm wafer, just a 1% drop in yield results in a loss of 1.5 million dollars per production run. The same data also states that detecting defects before the lithography process can save 5,200 dollars per wafer. What these figures show is simple. How early defects are caught determines unit cost.

    According to data from the United States Patent and Trademark Office, yield loss caused by particle contamination in the metal process stage reaches 6.8%, more than twice the 2.7% loss rate in the polysilicon process. Each process stage carries a different level of contamination risk, and understanding that weight accurately is emerging as the first condition for process dieting.

    A backgrinding process that physically and precisely processes the wafer surface.

    Cleaning and Grinding, the Two Axes of the Unit Cost Equation

    Cleaning and grinding are the two sides of the semiconductor manufacturing unit cost equation. How uniformly and thinly a wafer can be ground, and how completely contamination particles can be removed from the surface, determine both yield and cost.

    In the backgrinding process, logic gates are ground to about 100µm, DRAM memory to about 50µm, and MEMS devices to about 30µm. As thickness decreases, allowable tolerance becomes narrower. According to industry standards cited by Semiconductor Digest, even at a final thickness of around 20µm, thickness tolerance must be maintained at 1µm or less. If grinding precision fluctuates even slightly, every process built on top of it fluctuates as well.

    The cleaning process is no different. According to Hielscher Ultrasonics, liquid jets formed by ultrasonic cavitation disperse particle aggregates at speeds reaching 1000km per hour. If this principle is not precisely controlled, fine particles left on the surface become variables that affect the quality of the entire downstream process. This is why multistage cleaning methods that combine micro bubbles, water jets, and air knives step by step are gaining attention.

    How the precision of both cleaning and grinding is secured and maintained is the practical key to process dieting.

    Automated defect inspection of wafers on a conveyor belt under illumination.

    Blocking Defects at the Beginning of the Process

    From the perspective of manufacturing site managers, the situation they most want to avoid is discovering defects only in the back-end process. A single defect missed at the front end can invalidate all costs invested in subsequent processes.

    Huvics combines proprietary ultrasonic dispersion technology with vision inspection algorithms to implement a method that blocks this issue at the beginning of the process. While material particles in liquid are uniformly dispersed at the micro level, vision algorithms detect defects in fine patterns in real time and control process variability. In MLCC and FPCB processes, the convergence of these two technologies functions as a direct means of improving quality stability.

    Issues repeatedly encountered in the field, such as defects in semiconductor tape bonding processes, challenges in semiconductor tray cleaning, and foreign material defects in camera modules, also find solution paths through the same technological structure. As early process assembly reliability is secured, back-end rework costs and defect handling costs decrease, and those savings directly lead to improved unit cost. This is where the meaning of managing cleaning, inspection, and grinding precision in one integrated flow can be seen in unit cost dieting.

    Neatly aligned wafers demonstrating the importance of quality control across the entire process.

    Reducing semiconductor manufacturing unit cost cannot be solved by changing only one process. Only when the points where contamination occurs, the sections where thickness deviations accumulate, and the flow where defects appear too late are examined from the perspective of the entire process does it become clear where costs are leaking. In an environment where a single-digit difference in yield can decide millions of dollars, managing the precision of cleaning and grinding from the beginning of the process is the quietest and most reliable path to reducing unit cost.


    Huvics is an advanced technology company that develops and manufactures automation equipment and
    production systems across the semiconductor, LED, Mobile, and Cosmetic industries.
    With top-tier talent and continuous technological innovation, we support customers in improving productivity and
    securing quality competitiveness.

    Huvics Contact

    Phone: 031-374-8285
    Email: cdpark@huvics.com

    Contact Huvics

  • Why Process Integration Determines Yield in Semiconductor Cleaning, Grinding, and Lamination

    Why Process Integration Determines Yield in Semiconductor Cleaning, Grinding, and Lamination

    Finely designed semiconductor circuit patterns

    According to data from Semiconductor Equipment and Materials International (SEMI), a significant share of defects in semiconductor processes is reported to originate from particle contamination. This means that a single particle just a few micrometers in size, invisible to the naked eye, can undermine the yield of an entire chip. As processes become more miniaturized and package structures grow more complex, the precision of each stage, including cleaning, drying, grinding, and lamination, is emerging as a key factor that determines final product quality. By examining which technologies control these variables, we can see the direction in which digital transformation in semiconductor manufacturing is moving.

    Bubbles generated in liquid surrounding a semiconductor substrate

    Structure and Principles of a Multi-Stage Cleaning and Drying System

    Contaminants remaining on semiconductor surfaces are especially difficult to handle because they are not visible. Fine contamination made up of organic matter, metal residues, and particles is difficult to remove through simple physical washing. The approach developed to solve this problem is multi-stage cleaning technology.

    According to a study published in the Korean Journal of Chemical Engineering, a cleaning system using acoustic bubble arrays was shown to remove fine particles of various wettability and sizes with an efficiency of 92.5%. Microbubbles are generated at sizes of 5 nm or less, physically and chemically separating oils and fine particles from the substrate surface, while the following water jet pushes away suspended contaminants. In the air knife stage, remaining moisture and particles on the surface are removed by airflow, and the final oven drying process completely evaporates any moisture left after cleaning.

    Huvics’ 4-stage cleaning and drying system is designed to process this sequence within a single line. For automotive electronics components such as camera modules or autonomous driving sensors, which require both optical cleanliness and electrical reliability, a structure that continuously controls the process through drying is especially important. This is because residual moisture can lead to poor adhesion or corrosion in subsequent processes. The industry is shifting from a method that separated cleaning and drying into individual processes toward an integrated inline system.

    Processing the surface of a semiconductor wafer with a metal wheel and rotating tool

    Grinding and Lamination That Improve Package Process Precision

    As demand for AI semiconductors and high-performance memory increases, package structures are becoming increasingly complex. This is because the mainstream is shifting away from enclosing a single chip in encapsulant and toward structures that vertically stack multiple chips. This change is fundamentally raising the requirements for the grinding process.

    Thickness Uniformity in the Grinding Process

    In stacked packages, even a thickness deviation of only a few micrometers in each layer can directly lead to electrical connection defects or heat dissipation issues. According to published data from the patent office, rough grinding in the package grinding process takes about 2.5 to 5 minutes, while finish grinding takes about 2 to 4 minutes. The key is achieving the target thickness uniformly within this short time. Because required thickness and surface roughness differ by package type, such as FCBGA, WLCSP, and QFN/DFN, equipment must be able to combine diamond wheels with high-precision stages and set conditions differently at the micron level.

    Integrated Structure of the Lamination Process

    The same applies to the lamination process. If equipment is changed at each stage from tape mounting to UV curing, alignment errors accumulate between processes. To reduce this, a one-stop structure that processes everything from the expander to UV curing within a single system is being introduced. How well the processes can be integrated and how precisely the conditions of each stage can be controlled is the key factor that determines next-generation package yield.

    Overview of a manufacturing site with automated equipment arranged in a row

    Cleaning, grinding, and lamination may appear to be independent processes, but these three stages are connected as one quality chain. If the surface is not completely cleaned, grinding precision becomes unstable, and if thickness after grinding is not uniform, lamination adhesion becomes uneven. Digital transformation in semiconductor manufacturing is not an abstract concept. It begins with precisely controlling each of these connected links through data and automation.


    Huvics is an advanced technology company that develops and manufactures automation equipment and
    production systems across the semiconductor, LED, Mobile, and Cosmetic industries.
    With top talent and continuous technological innovation, we support customers in improving productivity and
    securing quality competitiveness.

    Huvics Contact

    Tel: 031-374-8285
    Email: cdpark@huvics.com

    Huvics Inquiry

  • Why Process Design Determines Yield in Semiconductor Cleaning and Lamination: Field Cases

    Why Process Design Determines Yield in Semiconductor Cleaning and Lamination: Field Cases

    A manufacturing site where various ultra precision electronic components such as camera modules are aligned

    In the past, the cleaning process for semiconductor components was regarded as a supporting task that simply washed away foreign matter. However, as component integration has increased and package structures have become more complex, the cleaning process has emerged as a key variable that determines yield and reliability. Now that components such as MLCC, FPCB, and camera modules, which require micron-level tolerances, have become mainstream, the scope and precision that cleaning technology must handle have fundamentally changed.

    Equipment showing an advanced precision cleaning process as micro bubbles are generated

    The new standards for cleaning technology shaped by miniaturization and high integration

    The miniaturization and high integration of semiconductor components have changed the very nature of contamination that the cleaning process must address. In an environment where a single particle of several tens of micrometers or less can lead to pattern shorts or bonding defects, simple spraying of cleaning solution is not enough to control surface contamination sufficiently.

    According to a study published in the Korean Journal of Chemical Engineering, a cleaning method using a micro bubble array achieved a cleaning efficiency of up to 92.5% and produced a jet velocity up to 5 times higher than that of a single cylinder structure. As the precision of the physical cleaning mechanism increases, particle removal efficiency rises as well.

    In manufacturing sites for ultra precision components such as camera modules, sensors, and VCM motors, the surface condition after cleaning directly affects the final assembly yield. As process environments become more demanding, the criteria for selecting cleaning technology must go beyond simple specification comparisons. Across the industry, the combination of cleaning methods is increasingly determined by the type of contamination being handled as well as the shape and material of the component.

    Automated equipment with ultrasonic dispersion and vision inspection systems operating a robotic arm

    The combination of ultrasonic dispersion and vision inspection

    One of the keys to improving the precision of the cleaning process lies in how uniformly particles in the liquid phase can be controlled. If particles agglomerate or become unevenly distributed in the cleaning solution, the cleaning energy applied to the surface becomes inconsistent, leaving contamination in specific areas.

    This is also why frequency selection is important in ultrasonic cleaning. For substrates with integrated precision circuit patterns such as FPCB, frequencies in the 35~40kHz range are suitable because they provide gentle cleaning energy while effectively separating fine contaminant particles.

    Huvics’ independently developed ultrasonic dispersion technology uniformly disperses material particles in the liquid phase at the micron level, stabilizing the physical properties of materials. When combined with vision inspection algorithms, it detects defects in remaining fine patterns after cleaning in real time and prevents defective products from moving on to the next process.

    Just as the uniformity of particle dispersion in the MLCC process leads directly to the stability of electrical characteristics, cleaning technology and inspection technology must operate within a single loop to substantially control quality variation. Whether the two technologies exist independently or are organically connected within the process flow is the key criterion in selecting a cleaning solution.

    Cleaning solution being precisely sprayed onto components inside a multi stage cleaning system

    The multi stage structure of the Cleaner System and criteria for application decisions

    The choice of cleaning method depends on the product shape, contamination type, and production scale. In structures where lenses and sensors are positioned close together, such as camera modules, the penetration path and discharge direction of the cleaning solution must be precisely designed. For components with large surface areas and complex shapes, such as semiconductor trays, a multi stage cleaning method is advantageous.

    The Huvics Cleaner System is composed of a multi stage cleaning structure that combines Micro Bubble, Water Jet, and Air Knife, and it completes the process flow through drying with an Oven Dry function at the end of the line. According to industry cases, processes that introduced UHP water jet cleaning reported a 40% reduction in cleaning preparation time. With both Full Auto and Manual options, the line can be configured according to production scale and automation level.

    Rather than looking only at cleaning efficiency, it is worth considering an approach that also designs the surface condition after drying and the connection with subsequent processes.

    A UV curing process in which a flat material is exposed under an ultraviolet light source

    The impact of integrated lamination processes on packaging quality

    The lamination process determines the quality of semiconductor packaging from a direction different from cleaning. When tape or protective film is precisely attached to a wafer or substrate, bubbles, wrinkles, or uneven adhesion can affect the entire subsequent process.

    In particular, UV curing is a step that must secure both adhesive strength and process stability, and curing speed and energy uniformity determine the production rhythm of the entire line. Analyses suggest that semi automatic laminators can improve productivity by up to 50% compared with manual feeding, but as the level of automation increases, process linkage design between equipment becomes more important.

    The Laminator System is designed to integrate key processes from Expander to Tape Mounting and UV Curing within a single system, reducing errors that occur during transfer between processes. Lamp and LED type UV Curing can be selectively applied, allowing curing conditions to be optimized according to component characteristics and adhesive materials.

    Integrating processes does not simply mean reducing the number of equipment units. It means reducing variables between each step and improving the reproducibility of quality, and this is where the significance of integrated lamination design becomes clear.

    A flawless circular surface symbolizing perfect surface control in semiconductor packaging and cleaning processes

    Cleaning and lamination may seem like separate processes, but ultimately they pursue the same goal. They control the surface condition and prepare the next process to begin under optimal conditions. As semiconductor components become smaller and more complex, the precision of this preparation carries greater weight in determining overall yield. What today’s manufacturing sites require is not merely choosing a specific technology, but designing the entire process as one continuous flow.


    Huvics is an advanced technology company that develops and manufactures automation equipment and
    production systems across the semiconductor, LED, Mobile, and Cosmetic industries.
    With top talent and continuous technological innovation, Huvics supports customers in improving productivity and
    securing quality competitiveness.

    Huvics Contact

    Phone: 031-374-8285
    Email: cdpark@huvics.com

    Huvics Inquiry

  • Are You Properly Managing the 2 Key Processes That Determine Semiconductor Packaging Yield

    Are You Properly Managing the 2 Key Processes That Determine Semiconductor Packaging Yield

    Semiconductor package samples arranged in various sizes and shapes

    In the semiconductor industry, ‘packaging’ was long regarded as a finishing step placed behind design and process work. However, as demand for AI accelerators and high-performance memory has surged, the situation has changed rapidly. Product competitiveness now depends not only on the performance of a single chip, but on how precisely multiple chips are stacked and connected. Packaging technology now stands at the center of a technology race as intense as semiconductor design itself.

    A diamond wheel uniformly grinding the surface of a semiconductor wafer

    Why Ultra-Precision Grinding Determines Yield

    High-bandwidth memory used in AI accelerators must process more than 1TB of data per second through a vertically stacked structure. To meet this requirement, each stacked chip must have uniform thickness, and surface flatness must also be controlled at the micron level. According to Mordor Intelligence, 3D stacked memory accounts for 34.28% of revenue share in the advanced semiconductor packaging market as of 2025, establishing itself as the leading technology.

    As package formats diversify, such as FCBGA, WLCSP, and QFN, thickness precision standards also vary by type. For example, WLCSP requires a fine pitch between 0.3mm and 0.5mm. Ultimately, grinding precision in the packaging process is a key variable that determines yield. Even a slight increase in thickness variation can undermine the electrical reliability of the entire stacked structure, directly leading to performance degradation in the final product.

    Huvics PKG Grinder responds to these standards with micron-level grinding using a diamond wheel. It is available in both Full Auto and Manual configurations, allowing flexible application according to the production line structure of each customer, while maintaining stable quality even in high-speed processes to achieve high yield. Machining precision is product reliability is the principle that most clearly explains the role this equipment plays in semiconductor packaging processes.

    A cleaning process that sprays liquid onto a semiconductor surface to remove contaminant particles

    Why the Cleaning Process Is the Starting Point of Quality

    If grinding determines the form of packaging, cleaning is the process that ensures this form can perform its intended function. A single fine particle remaining on the semiconductor surface can contaminate the entire subsequent process or lead to defects in the final product. Especially in components that require optical precision, such as camera modules or autonomous driving sensors, invisible contamination can quietly erode product reliability. This is why the cleaning process must be treated not as simple washing, but as the starting point of quality stability.

    Huvics Cleaner System removes contaminant particles from product surfaces by sequentially combining Micro Bubble, Water Jet, and Air Knife, and consistently handles the drying process through its Oven Dry function. Cleaning conditions can be configured differently according to product types such as camera modules, sensors, VCM motors, and trays, enabling a single system to address diverse process requirements.

    In practice, many cases have shown that defects occurring in semiconductor tape bonding processes and yield loss in camera modules can be resolved by improving the cleaning process. Reducing particles reduces defects, and reducing defects increases yield. Engineers who have worked with cleaning processes know well how difficult it is to implement this simple connection in the field. The significance of precision cleaning is confirmed by the fact that it is not the end of the process, but the foundation of quality.

    Precisely processed semiconductor packages arranged in a row

    The competition in semiconductor packaging technology is now shifting toward process precision as much as chip design. Grinding and cleaning are the two pillars that support yield and reliability in this competition. If either one becomes unstable, even the most sophisticated package design will struggle to deliver its intended performance in the field. In an era when technological precision becomes product competitiveness, how firmly each and every process is built will ultimately determine a company’s position in the future semiconductor market.


    Huvics is an advanced technology company that develops and manufactures automation equipment and
    production systems across the semiconductor, LED, Mobile, and Cosmetic industries.
    With top talent and continuous technological innovation, we support customers in improving productivity and
    securing quality competitiveness.

    Huvics Contact

    Tel: 031-374-8285
    Email: cdpark@huvics.com

    Contact Huvics

  • A Case Where Cleaning Choices Verified on the Process Floor Changed Semiconductor Yield

    A Case Where Cleaning Choices Verified on the Process Floor Changed Semiconductor Yield

    A wafer placed on equipment inside a cleanroom

    A semiconductor process is like an operating room. Just as a scalpel moves in micron units and a tiny foreign particle left on a surgical tool can change a patient outcome, a single particle left during the process can determine the fate of an entire chip. An environment where cleanliness becomes the prerequisite for technology, this is the reality of today’s semiconductor manufacturing sites.

    Fine particles scattered across circuit patterns on a semiconductor circuit board

    As nodes shrink, the impact of contaminant particles grows

    In semiconductor processes, the impact of contaminant particles on yield increases nonlinearly as nodes become smaller. In a 28nm process, a 1 micrometer particle is treated as practically harmless because the chance of colliding with circuit patterns is low. However, according to an analysis by Applied Physics USA, a particle of the same size becomes a critical defect source in a 5nm process because it exceeds the circuit line width itself.

    During the photolithography stage, even a single fine particle settling on the wafer surface can make the entire die subject to disposal. Particles smaller than 0.5 micrometers penetrate into areas that are difficult even to detect with conventional contamination control methods.

    The relationship between defect density and yield is also clear in numerical terms. Patent literature confirms that in a 1 gigabit DRAM process, reducing defect density from 0.10 Defects/cm² to 0.01 Defects/cm² raises process yield from 12% to 81%. As process miniaturization advances, the threshold for acceptable contamination levels becomes lower, and cleaning is emerging as a structure that directly determines yield.

    Cleaning a wafer surface with high-pressure spray water through a nozzle

    Why cleaning has become a core process

    The status of cleaning on the production floor has changed because the process structure itself has changed. In the past, cleaning was considered a final step that removed foreign matter from the product surface. However, in sites where complex structures and materials coexist, such as camera modules, semiconductor trays, and tape bonding processes, contamination control is required at every intermediate process stage.

    Advanced packaging methods such as WLCSP, which remove the substrate and mount the die directly on the main PCB, reduce process steps but require higher cleanliness at each step. Because there is no structural margin to compensate for differences in thermal expansion coefficients between silicon and substrate materials, fine foreign matter left on the bonding surface leads directly to reliability issues.

    This is also why multi-stage cleaning technology is attracting attention. A cleaning method that combines Micro Bubble, Water Jet, and Air Knife separates and treats contaminant particles by stage, including types that are difficult to remove with a single method. When an oven drying function is also installed, the possibility of secondary contamination caused by residual moisture after cleaning is blocked as well. Which combination of cleaning technologies is selected becomes the key turning point for final quality stability.

    Precision grinding of a semiconductor package using a diamond wheel

    Precision machining and cleaning form one quality management system

    Precision machining and cleaning should be understood not as independent processes, but as one continuous quality management system. When processing advanced packages with extremely high requirements for thickness uniformity and flatness, such as FCBGA, WLCSP, QFN, and DFN, the precision of the grinding process alone cannot guarantee completion quality.

    Even when micron-level grinding is performed using a diamond wheel and a high-precision stage, grinding byproducts and fine particles remaining on the surface after machining act as contamination sources in the next process. Huvics PKG Grinder is equipment designed to meet these ultra-precision grinding requirements, and yield and reliability can be secured at the same time when process design linked through the cleaning stage after grinding is reviewed together.

    As machining precision increases, the allowable range for residual contamination becomes even narrower, and the role of cleaning expands to fill that gap. This is where the significance of the proposition that precision machining and cleaning must be designed together as processes become more miniaturized can be confirmed.

    Semiconductor chips and a microscope arranged on a clean workbench

    Just as cleanliness in an operating room is as important as surgical skill, cleaning in semiconductor manufacturing carries the same weight as process technology. As nodes shrink and packages become thinner, the margin for allowable contamination disappears. Only when cleaning is viewed as the starting point of process design can meaningful improvements in yield and reliability begin.


    Huvics is an advanced technology company that develops and manufactures automation equipment and
    production systems across the semiconductor, LED, Mobile, and Cosmetic industries.
    With outstanding talent and continuous technological innovation, we support customers in improving productivity and
    securing quality competitiveness.

    Huvics Contact

    Phone: 031-374-8285
    Email: cdpark@huvics.com

    Huvics Inquiry

  • How can ultra precision machining, cleaning, and process integration increase both yield and quality reliability?

    How can ultra precision machining, cleaning, and process integration increase both yield and quality reliability?

    Until now, many manufacturing sites have focused on increasing machining precision while placing cleaning and process integration at a lower priority. Even if equipment performance is improved, if the connection between processes is broken or microscopic contamination remains in the cleaning stage, the precision achieved with great effort cannot translate into yield. Now is the time for an approach that designs machining, cleaning, and process integration as one continuous flow.

    Precisely machined metal components revealed under lighting.

    Why ultra precision machining has become a basic requirement in modern manufacturing

    As semiconductor packaging technology advances, the allowable range of machining error continues to narrow. In the past, tolerances of several tens of microns were sufficient, but in structures that vertically stack dozens of chips, such as AI semiconductors and high performance memory, the uniformity of package thickness determines the reliability of the entire product.

    Ultra precision machining operates at tolerance levels of ±0.001mm, or 1 micron, or less, and the latest research is expanding into areas that require dimensional tolerances below 10 nanometers and atomic level surface smoothness. As package types become more diverse, including FCBGA, WLCSP, and QFN·DFN, the grinding precision required for each structure also varies.

    When errors invisible to the eye accumulate within a stacked structure, they affect both the electrical characteristics and mechanical durability of the final product. This is not simply a matter of equipment performance, but an issue across the entire process design. Grinding methods that combine diamond wheels with high precision stages have evolved to maintain stable quality even during high speed processes in order to meet these requirements. The trend is already clear: securing machining precision is no longer an option in modern manufacturing, but a basic requirement.

    The surface of a semiconductor component where cleaning fluid is precisely sprayed through a spray nozzle.

    How the cleaning process determines yield and quality reliability

    No matter how high machining precision becomes, yield collapses if microscopic contamination remains in the cleaning stage. Particle Removal Efficiency, or PRE, a key metric used in semiconductor cleaning processes, is a standard that numerically indicates how much contaminant particles have been removed from the surface of wafers or components. According to TSI analysis, particles left behind due to insufficient cleaning can cause critical defects in later processes, and continuous PRE monitoring is essential for maintaining yield and minimizing defects.

    Research findings show that particle removal efficiency typically reaches more than 99%, but decreases to around 94% for ultrafine particles at the 0.064 micron level. As particle size becomes smaller, removal difficulty increases, and the design of the cleaning method must become more precise.

    A multi stage cleaning method that combines micro bubbles, water jet, and air knife is a technical approach for responding to this ultrafine contamination, delivering effectiveness across a wider range of particle sizes than a single method. The drying process after cleaning also plays an important role in preventing contamination from reattaching, and if this stage is incomplete, the cleaning effect is reduced. For components where surface cleanliness is directly linked to performance, such as camera modules, autonomous driving sensors, and VCM motors, the design level of the cleaning process becomes the key factor that determines final quality.

    An automated line where process stages such as grinding, lamination, and cleaning are organically connected.

    Process design that connects grinding, lamination, and cleaning into one flow

    Anyone responsible for a manufacturing site knows well that process defects rarely originate from a single cause. Defects in the semiconductor tape bonding process may be problems with the bonding itself, but they are also often caused by surface conditions before attachment or mismatched UV curing conditions. Tray cleaning challenges also cannot be solved simply by replacing cleaning equipment unless contamination types and material characteristics are considered together. In this way, process defects are often not problems of one specific stage, but occur across the entire connected flow.

    Based on this field context, Huvics adopts a method of designing grinding, lamination, cleaning, and drying processes as one flow. A one stop lamination process that continues from the Expander to UV curing reduces gaps between process stages to shorten tact time, the unit time required to produce one product, and enables an integrated response to issues involving complex causes, such as improving the defect rate of camera modules. The ability to flexibly select Full Auto and Manual configurations also makes it possible to adjust solutions to the practical conditions of the production line. These cases show where the starting point lies for reducing defects already anticipated in process design.

    Multiple robot grippers moving and processing precision components in a row.

    Machining precision, cleaning efficiency, and process integration may seem like separate tasks, but in actual manufacturing sites they are one connected issue. Securing micron level grinding tolerances, designing a cleaning process that removes even ultrafine particles, and connecting each stage without interruption is the way to increase both yield and quality reliability. For manufacturing to maintain a technological edge in global competition, it needs a perspective that views these three elements as one continuous flow.


    Huvics is an advanced technology company that develops and manufactures automation equipment and
    production systems across the semiconductor, LED, Mobile, and Cosmetic industries.
    With top talent and continuous technological innovation, we support customers in improving productivity and
    securing quality competitiveness.

    Huvics Contact Information

    Phone: 031-374-8285
    Email: cdpark@huvics.com

    Contact Huvics